Dentro de los actos de celebración del IEEEDay se va a llevar a cabo el Workshop titulado «The opportunities of building IEEE Standards for Europe, Middle East and Africa». La agenda del evento es la siguiente:

AGENDA
18:00 – Ceremony of IEEE Spain Awards 2019.
Jesús Fraile – IEEE Spain Section Chair
Stephen Welby – Executive Director and Chief Operating Officer of IEEE. USA.

18:30 – Opening Talk.
Stephen Welby – Executive Director and Chief Operating Officer of IEEE. USA.

18:45 – Introduction.
Oscar M Bonastre – IEEE Chair Elect 2020-2021 Spain Section. Prof. Advanced Distributed
Systems, Miguel Hernandez University, Spain.

18:50 – Why Standards Matter? Developing standards within IEEE-SA: Process & Governance.
David Law – Distinguished Technologist at Hewlett Packard Enterprise. IEEE representative to
European Commission ICT Standardization Platform, IEEE R8 standards coordinator. UK.

19:05 – IEEE standardization and certification initiatives around Artificial Intelligence.
Clara Neppel. Senior Director of the IEEE Global Office in Vienna. Austria

19:15 – IEEE standards shaping the future of road transportation.
Hermann Brand – European Standards Affairs Director IEEE Technology Centre. Austria
David Law – Distinguished Technologist at Hewlett Packard Enterprise. IEEE representative to
European Commission ICT Standardization Platform, IEEE R8 standards coordinator. UK.

19:35 – The need of interoperability in the field of e-health.
Christopher James, Professor of Biomedical Engineering. Director of Warwick Engineering in Biomedicine,
University of Warwick, UK.

19:45 – The need of Blockchain standards.
Brian Heinen. Founder, Local Producer Ltd and the Blockchain in Europe Group

19:55 – Interaction between the speakers and questions from audience.
Moderator: Oscar M Bonastre – IEEE Chair Elect 2020-2021 Spain Section. Prof. Advanced
Distributed Systems, Miguel Hernandez University, Spain.

This workshop is open to public. Please confirm attendance, before Oct. 7th, through the following link: https://events.vtools.ieee.org/m/204746